Epitaxial alloyed films out of the bulk stability domain: Surface structure and composition of Ni3Al and NiAl films on a stepped Ni(1 1 1) surface

Surface Science

Volumn 604, Issue 9-10, 2010, Pages 770-778

  Prevot G ^a   Schmaus, D ^a,b   Moal, S Le ^c  

^a INSTITUT DES NANOSCIENCES DE PARIS   (France)

^b UNIVERSITÉ PARIS DESCARTES   (France)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Alloy; Aluminium; Auger Electron Spectroscopy (AES); Epitaxy; Growth; Nickel; Spot Profile Analysis Low Energy Electron Diffraction (SPA LEED)

Indexed keywords

ALLOYED LAYERS; ALUMINIUM; BULK ALLOYS; CONCENTRATION RANGES; EPITAXY; FLAT SURFACES; INTER-DIFFUSION; LATTICE UNITS; SPA-LEED; SPOT PROFILE ANALYSIS; STABILITY DOMAINS;

ALLOYS; ALUMINUM; AUGERS; BALLOONS; CERIUM ALLOYS; CRYSTAL GROWTH; ELECTRONS; EPITAXIAL FILMS; LOW ENERGY ELECTRON DIFFRACTION; NICKEL ALLOYS; SPECTRUM ANALYSIS; SURFACE STRUCTURE;

AUGER ELECTRON SPECTROSCOPY;

EID: 77950516864     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.01.025     Document Type: Article

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