SCOPUS 정보 검색 플랫폼

Volumn 96, Issue 13, 2010, Pages

Electrical switching behavior from ultrathin potential barrier of self-assembly molecules tuned by interfacial charge trapping

(8) Li, Yun a Qiu, Danfeng a Cao, Liqiang a Shao, Chenxu a Pan, Lijia a Pu, Lin a Xu, Jianbin b Shi, Yi a

a NANJING UNIVERSITY (China)

b CHINESE UNIVERSITY OF HONG KONG (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSPORT; ELECTRICAL SWITCHING; ELECTRICAL TRANSITION; INTERFACIAL CHARGE; INTERFACIAL PROPERTY; ORGANIC SEMICONDUCTOR; POTENTIAL BARRIERS; SWITCHING BEHAVIORS; ULTRA-THIN;

CHARGE TRAPPING; MOLECULES; NUCLEAR PHYSICS;

SELF ASSEMBLY;

EID: 77950475705 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3373611 Document Type: Article

Times cited : (13)

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