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Volumn 96, Issue 13, 2010, Pages

High performance airbrushed organic thin film transistors

(10) Chan, Calvin K a Richter, Lee J a Dinardo, Brad a Jaye, Cherno a Conrad, Brad R a Ro, Hyun Wook a Germack, David S a Fischer, Daniel A a Delongchamp, Dean M a Gundlach, David J a

a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE LAYER; AVERAGE DIAMETER; CHANNEL INTERFACE; HIGH MOLECULAR MASS; INHOMOGENEITIES; NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPIES; ORGANIC THIN FILM TRANSISTORS; POLY-3-HEXYLTHIOPHENE; SATURATION REGIME; SPRAY-DEPOSITED; STRUCTURAL METHODS;

ATOMIC FORCE MICROSCOPY; GATE DIELECTRICS; GATES (TRANSISTOR); THIN FILM TRANSISTORS; X RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

ABSORPTION SPECTROSCOPY;

EID: 77950470851 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3360230 Document Type: Article

Times cited : (57)

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