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Volumn 96, Issue 13, 2010, Pages

Large electric field induced strains in ferroelectric islands

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; C-DOMAIN; DOMAIN SWITCHINGS; EFFECTIVE MECHANISMS; ELECTRIC-FIELD-INDUCED STRAIN; INTERNAL STRESS FIELDS; LARGE STRAINS; PHASE-FIELD MODELING;

EID: 77950469663     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3373915     Document Type: Article
Times cited : (11)

References (13)
  • 3
    • 0842343626 scopus 로고    scopus 로고
    • NMAACR 1476-1122,. 10.1038/nmat1051
    • X. Ren, Nature Mater. NMAACR 1476-1122 3, 91 (2004). 10.1038/nmat1051
    • (2004) Nature Mater. , vol.3 , pp. 91
    • Ren, X.1
  • 4
    • 12844282353 scopus 로고    scopus 로고
    • 3 ceramics
    • DOI 10.1063/1.1829394
    • L. X. Zhang, W. Chen, and X. Ren, Appl. Phys. Lett. APPLAB 0003-6951 85, 5658 (2004). 10.1063/1.1829394 (Pubitemid 40162554)
    • (2004) Applied Physics Letters , vol.85 , Issue.23 , pp. 5658-5660
    • Zhang, L.X.1    Chen, W.2    Ren, X.3
  • 5
    • 41349097497 scopus 로고    scopus 로고
    • Three-dimensional phase-field simulation of domain structures in ferroelectric islands
    • DOI 10.1063/1.2903107
    • J. X. Zhang, R. Wu, S. Choudhury, Y. L. Li, S. Y. Hu, and L. Q. Chen, Appl. Phys. Lett. APPLAB 0003-6951 92, 122906 (2008). 10.1063/1.2903107 (Pubitemid 351451662)
    • (2008) Applied Physics Letters , vol.92 , Issue.12 , pp. 122906
    • Zhang, J.X.1    Wu, R.2    Choudhury, S.3    Li, Y.L.4    Hu, S.Y.5    Chen, L.Q.6
  • 8
    • 13644279105 scopus 로고    scopus 로고
    • 3 epitaxial thin films
    • DOI 10.1063/1.1849820, 034112
    • Y. L. Li, S. Y. Hu, and L. Q. Chen, J. Appl. Phys. JAPIAU 0021-8979 97, 034112 (2005). 10.1063/1.1849820 (Pubitemid 40232265)
    • (2005) Journal of Applied Physics , vol.97 , Issue.3 , pp. 0341121-0341127
    • Li, Y.L.1    Hu, S.Y.2    Chen, L.Q.3
  • 10
    • 79958241557 scopus 로고    scopus 로고
    • Size effect in mesoscopic epitaxial ferroelectric structures: Increase of piezoelectric response with decreasing feature size
    • DOI 10.1063/1.1475369
    • S. Bühlmann, B. Dwir, J. Baborowski, and P. Muralt, Appl. Phys. Lett. APPLAB 0003-6951 80, 3195 (2002). 10.1063/1.1475369 (Pubitemid 34562602)
    • (2002) Applied Physics Letters , vol.80 , Issue.17 , pp. 3195
    • Buhlmann, S.1    Dwir, B.2    Baborowski, J.3    Muralt, P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.