메뉴 건너뛰기




Volumn 21, Issue 4, 2010, Pages 349-354

Orthogonal analysis for perovskite structure microwave dielectric ceramic thin films fabricated by the RF magnetron-sputtering method

Author keywords

[No Author keywords available]

Indexed keywords

COMPREHENSIVE EVALUATION; DIELECTRIC THIN FILMS; FILM QUALITY; MICROWAVE DIELECTRIC CERAMICS; OPTIMAL PROCESS; ORTHOGONAL ANALYSIS; PEROVSKITE STRUCTURES; PROCESS PARAMETERS; RADIO FREQUENCY MAGNETRON SPUTTERING; RF MAGNETRONS; RF-MAGNETRON SPUTTERING; SPUTTERING METHODS; SPUTTERING POWER; SPUTTERING PRESSURES; SUBSTRATE TEMPERATURE; WORKING GAS;

EID: 77950369762     PISSN: 09574522     EISSN: 1573482X     Source Type: Journal    
DOI: 10.1007/s10854-009-9919-y     Document Type: Article
Times cited : (79)

References (9)
  • 3
    • 33646748485 scopus 로고    scopus 로고
    • Key problems in the preparation of(Ba,Sr)TiO3 thin films by RF magnetron reactive sputter deposition
    • M Jun F Jie Y Chun-sheng D Gui-fu 2006 Key problems in the preparation of(Ba,Sr)TiO3 thin films by RF magnetron reactive sputter deposition Piezoelectrics Acoustooptrics 28 2 205 208
    • (2006) Piezoelectrics Acoustooptrics , vol.28 , Issue.2 , pp. 205-208
    • Jun, M.1    Jie, F.2    Chun-Sheng, Y.3    Gui-Fu, D.4
  • 5
    • 33751067779 scopus 로고    scopus 로고
    • Structure-properties correlations for barium titanate thin films obtained by rf-sputtering
    • 10.1016/j.jeurceramsoc.2006.05.043 1:CAS:528:DC%2BD28Xht1WntrbP
    • A Ianculescu B Despax V Bley T Lebey, et al. 2007 Structure-properties correlations for barium titanate thin films obtained by rf-sputtering J. Eur. Ceramic Soc. 27 10 1129 1135 10.1016/j.jeurceramsoc.2006.05.043 1:CAS:528:DC%2BD28Xht1WntrbP
    • (2007) J. Eur. Ceramic Soc. , vol.27 , Issue.10 , pp. 1129-1135
    • Ianculescu, A.1    Despax, B.2    Bley, V.3    Lebey, T.4
  • 6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.