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Diamond and Related Materials

Volumn 19, Issue 5-6, 2010, Pages 630-636

Comparison of the XPS spectra from homoepitaxial {111}, {100} and polycrystalline boron-doped diamond films

(4) Ghodbane, S a,b Ballutaud, D c Omnes F a Agnes C a

a LABORATOIRE DE CRISTALLOGRAPHIE (France)

b p BeSt Coating GmbH (Austria)

c Centre National de la Recherche Scientifique (France)

Author keywords

Boron doping; CVD diamond; XPS

Indexed keywords

BORON; PHASE SEPARATION; SEMICONDUCTOR DOPING; X RAY PHOTOELECTRON SPECTROSCOPY;

BORON CONCENTRATIONS; BORON-DOPING; CVD DIAMOND; HOMOEPITAXIAL FILMS; NATURE OF SURFACE; POLYCRYSTALLINE BORONS; POLYCRYSTALLINE FILM; RELATIVE CONCENTRATION;

DIAMOND FILMS;

EID: 77950369760 PISSN: 09259635 EISSN: None Source Type: Journal
DOI: 10.1016/j.diamond.2010.01.014 Document Type: Article

Times cited : (89)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.