Characterization of boron doped CVD diamond films by Raman spectroscopy and X-ray diffractometry

Diamond and Related Materials

Volumn 11, Issue 8, 2002, Pages 1578-1583

  Goncalves J A N ^a   Sandonato, G M ^a   Iha, K ^b  

^a INSTITUTO NACIONAL DE PESQUISAS ESPACIAIS   (Brazil)

^b INSTITUTO TECNOLÓGICO DE AERONÁUTICA   (Brazil)

Author keywords

Diamond films; Lattice parameter; Raman spectroscopy; X ray diffractometry

Indexed keywords

BORON; CHEMICAL VAPOR DEPOSITION; DOPING (ADDITIVES); LATTICE CONSTANTS; RAMAN SPECTROSCOPY; SILICON; THERMAL EFFECTS; X RAY DIFFRACTION ANALYSIS;

CRYSTALLOGRAPHIC DIRECTION;

DIAMOND FILMS;

DIAMOND;

EID: 0036646980     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0925-9635(02)00103-6     Document Type: Article

References (15)