Monitoring structural defects and crystallinity of carbon nanotubes in thin films

Pramana - Journal of Physics

Volumn 74, Issue 3, 2010, Pages 447-455

  Mahajan, S S ^a   Bambole, M D ^a   Gokhale, S P ^a   Gaikwad, A B ^a  

^a NATIONAL CHEMICAL LABORATORY   (India)

Author keywords

Carbon nanotubes; Chemical vapour deposition; Raman spectroscopy; Scanning electron microscopy; Thin films

Indexed keywords

AS-GROWN; CHEMICAL VAPOUR DEPOSITION; CRYSTALLINITIES; HIGH CRYSTALLINITY; INTENSITY RATIO; MULTI-WALLED; NANOTUBE STRUCTURE; RAMAN MEASUREMENTS; REACTION TEMPERATURE; SEM; STRUCTURAL DEFECT; THERMAL CVD; THERMAL DECOMPOSITIONS;

CARBON FILMS; CARBON NANOTUBES; CATALYSTS; DEFECTS; DEPOSITION; METHANE; PYROLYSIS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; THERMOGRAVIMETRIC ANALYSIS; THIN FILMS;

CHEMICAL VAPOR DEPOSITION;

EID: 77950267935     PISSN: 03044289     EISSN: None     Source Type: Journal    
DOI: 10.1007/s12043-010-0040-9     Document Type: Article

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