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Volumn , Issue , 2009, Pages

Analytical investigation of the variations of nano-film densities with thickness

Author keywords

Density; Elastic parameters; Nanofilms; Thickness

Indexed keywords

DENSITY (SPECIFIC GRAVITY); II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; MAGNESIA; SILICA; SILICON CARBIDE; ZINC OXIDE;

EID: 77949956514     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICTONMW.2009.5385549     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 10
    • 0029271948 scopus 로고    scopus 로고
    • Y. C. Lee, J. O. Kim and J. D. Achenbach, IEEE Trans. Ultrasonics, 42, pp. 253-264, 1995.
    • Y. C. Lee, J. O. Kim and J. D. Achenbach, IEEE Trans. Ultrasonics, vol. 42, pp. 253-264, 1995.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.