메뉴 건너뛰기




Volumn , Issue , 2008, Pages

MultiGate SOI MOSFETs: Accumulation-mode vs. enhancement-mode

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATION MODES; CURRENT DRIVES; ENHANCEMENT-MODE; EXPERIMENTAL DATA; MULTI-GATE FETS; PROCESS VARIABILITY; SOI-MOSFETS;

EID: 77949925420     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SNW.2008.5418482     Document Type: Conference Paper
Times cited : (5)

References (8)
  • 1
    • 85120182885 scopus 로고    scopus 로고
    • W. Xiong et al., Electrochemical Society Transactions, 6 (4), 2007, pp. 59-69
    • W. Xiong et al., Electrochemical Society Transactions, Vol. 6 (4), 2007, pp. 59-69
  • 2
    • 4344606224 scopus 로고    scopus 로고
    • J. Wang et al., J.A.P., 96 (4), 2004, pp. 2192-2203
    • J. Wang et al., J.A.P., Vol. 96 (4), 2004, pp. 2192-2203
  • 4
    • 5444219526 scopus 로고    scopus 로고
    • L. Chang et al., IEEE TED, 2004, Vol.51 (10), pp. 1621-1627
    • (2004) IEEE TED , vol.51 , Issue.10 , pp. 1621-1627
    • Chang, L.1
  • 7
    • 0025404175 scopus 로고
    • J.P. Colinge, IEEE TED, Vol. 37 (3) 1990, pp. 718-723
    • (1990) IEEE TED , vol.37 , Issue.3 , pp. 718-723
    • Colinge, J.P.1
  • 8
    • 33646915205 scopus 로고    scopus 로고
    • W. Cheng et al., Jpn. J. Appl. Phys., 45 (4B), 2006, pp. 3110-3116
    • W. Cheng et al., Jpn. J. Appl. Phys., Vol. 45 (4B), 2006, pp. 3110-3116


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.