Investigation of the refractive index and dispersion parameters of tungsten oxynitride thin films

Materials Chemistry and Physics

Volumn 121, Issue 1-2, 2010, Pages 249-253

  Mohamed, S H ^a,b   Shaaban, E R ^b,c  

^a Sohag University   (Egypt)

^b QASSIM UNIVERSITY   (Saudi Arabia)

^c AL AZHAR UNIVERSITY   (Egypt)

Author keywords

Dispersion parameters; Refractive index; WOxNy

Indexed keywords

CAUCHY DISPERSION; COORDINATION NUMBER; DISPERSION PARAMETERS; DUAL MAGNETRON SPUTTERING; ENVELOPE METHOD; GLASS SUBSTRATES; NITROGEN CONTENT; OPTICAL TRANSMITTANCE; OXYNITRIDES; REFLECTANCE MEASUREMENTS; SPECTRAL RANGE;

AMORPHOUS FILMS; ARGON; DISPERSIONS; LIGHT REFRACTION; NITRIDES; ORGANIC POLYMERS; OXYGEN; REFRACTIVE INDEX; REFRACTOMETERS; SUBSTRATES; THIN FILMS; TUNGSTEN; X RAY DIFFRACTION;

DISPERSION (WAVES);

EID: 77949656871     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchemphys.2010.01.028     Document Type: Article

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