Diffraction gratings as small-angle X-ray scattering calibration standards

Journal of Applied Crystallography

Volumn 43, Issue 2, 2010, Pages 350-351

  Nygard K ^a   Bunk, O ^a   Perret, E ^a   David, C ^a   Van Der Veen, J F ^a,b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77949539036     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S002188981000467X     Document Type: Article

References (9)

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