Two-dimensional software reliability measurement technologies

IEEM 2009 - IEEE International Conference on Industrial Engineering and Engineering Management

Volumn , Issue , 2009, Pages 223-227

  Inoue, Shinji ^a   Yamada, Shigeru ^a  

^a TOTTORI UNIVERSITY   (Japan)

Author keywords

Goodness of fit; Modeling frameworks; Testing effort factor; Testing time factor; Two dimensional software reliability growth models; Two dimensional stochastic processes

Indexed keywords

GOODNESS-OF-FIT; MODELING FRAMEWORKS; SOFTWARE RELIABILITY GROWTH MODELS; STOCHASTIC PROCESS; TIME FACTORS;

BIOACTIVITY; COMPUTER SOFTWARE SELECTION AND EVALUATION; ENGINEERING; INDUSTRIAL ENGINEERING; PEPTIDES; QUALITY ASSURANCE; RANDOM PROCESSES; RELIABILITY ANALYSIS; STOCHASTIC MODELS; STOCHASTIC SYSTEMS; TWO DIMENSIONAL;

SOFTWARE RELIABILITY;

EID: 77949493305     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEEM.2009.5373378     Document Type: Conference Paper

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