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Volumn , Issue , 2006, Pages 3-10

Two-dimensional software reliability models and their application

Author keywords

Bivariate fault detection time distributions; Non homogeneous poisson processes; Software reliability; Test execution time; Testing effort; Two dimensional models

Indexed keywords

COMPUTER SOFTWARE SELECTION AND EVALUATION; MATHEMATICAL MODELS; POISSON EQUATION; SOFTWARE TESTING; TWO DIMENSIONAL;

EID: 40349098352     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PRDC.2006.64     Document Type: Conference Paper
Times cited : (22)

References (26)
  • 2
    • 0035373296 scopus 로고    scopus 로고
    • Effect of code coverage on software reliability measurement
    • Chen, M., Lyu, M. R. and Wong, E. (2001), Effect of code coverage on software reliability measurement, IEEE Transactions on Reliability, 50 (2), 165-170.
    • (2001) IEEE Transactions on Reliability , vol.50 , Issue.2 , pp. 165-170
    • Chen, M.1    Lyu, M.R.2    Wong, E.3
  • 3
    • 0001358334 scopus 로고
    • Bivariate exponential distribution in reliability theory
    • Downton, F. (1970), Bivariate exponential distribution in reliability theory, Journal of the Royal Statistical Society, Series B, 32 (3), 408-417.
    • (1970) Journal of the Royal Statistical Society, Series B , vol.32 , Issue.3 , pp. 408-417
    • Downton, F.1
  • 4
    • 0018505572 scopus 로고
    • Time-dependent error-detection rate model for software reliability and other performance measures
    • Goel, A. L. and Okumoto, K. (1979), Time-dependent error-detection rate model for software reliability and other performance measures, IEEE Transactions on Reliability, R-28 (3), 206-211.
    • (1979) IEEE Transactions on Reliability , vol.R-28 , Issue.3 , pp. 206-211
    • Goel, A.L.1    Okumoto, K.2
  • 5
    • 0022252694 scopus 로고
    • Software reliability models: Assumptions, limitations, and applicability
    • Goel, A. L. (1985), Software reliability models: assumptions, limitations, and applicability, IEEE Transactions on Software Engineering, SE-11 (12), 1411-1423.
    • (1985) IEEE Transactions on Software Engineering , vol.SE-11 , Issue.12 , pp. 1411-1423
    • Goel, A.L.1
  • 6
    • 3142758882 scopus 로고    scopus 로고
    • Analysis of software fault removal policies using a non-homogeneous continuous time Markov chain
    • Gokhale, S. S., Lyu, M. R. and Trivedi, K. S. (2004), Analysis of software fault removal policies using a non-homogeneous continuous time Markov chain, Software Quality Journal, 12 (3), 211-230.
    • (2004) Software Quality Journal , vol.12 , Issue.3 , pp. 211-230
    • Gokhale, S.S.1    Lyu, M.R.2    Trivedi, K.S.3
  • 9
    • 0036733276 scopus 로고    scopus 로고
    • Analysis of incorporating logistic testing-effort function into software reliability modeling
    • Huang, C.-Y. and Kuo, S.Y (2002), Analysis of incorporating logistic testing-effort function into software reliability modeling, IEEE Transactions on Reliability, 51 (3), 261-270.
    • (2002) IEEE Transactions on Reliability , vol.51 , Issue.3 , pp. 261-270
    • Huang, C.-Y.1    Kuo, S.Y.2
  • 10
    • 11144281844 scopus 로고    scopus 로고
    • Performance analysis of software reliability growth models with testing-effort and change point
    • Huang, C.-Y. (2005), Performance analysis of software reliability growth models with testing-effort and change point, Journal of Systems and Software, 76 (2), 181-194.
    • (2005) Journal of Systems and Software , vol.76 , Issue.2 , pp. 181-194
    • Huang, C.-Y.1
  • 11
  • 13
    • 0035466299 scopus 로고    scopus 로고
    • Framework for modeling software reliability, using various testing-efforts and fault-detection rates
    • Kuo, S.-Y., Huang, C.-Y. and Lyu, M. R. (2001), Framework for modeling software reliability, using various testing-efforts and fault-detection rates, IEEE Transactions on Reliability, 50 (3), 310-320.
    • (2001) IEEE Transactions on Reliability , vol.50 , Issue.3 , pp. 310-320
    • Kuo, S.-Y.1    Huang, C.-Y.2    Lyu, M.R.3
  • 17
    • 0001728803 scopus 로고
    • A generalized bivariate exponential distribution
    • Marshall, A. W and Olkin, I. (1967), A generalized bivariate exponential distribution, Journal of Applied Probability, 4, 291-302.
    • (1967) Journal of Applied Probability , vol.4 , pp. 291-302
    • Marshall, A.W.1    Olkin, I.2
  • 18
    • 0003517458 scopus 로고
    • Software reliability data,
    • Technical Report, Data and Analysis Center for Software, Rome Air Development Center, New York
    • Musa, J. D. (1979), Software reliability data, Technical Report, Data and Analysis Center for Software, Rome Air Development Center, New York.
    • (1979)
    • Musa, J.D.1
  • 21
    • 0019682019 scopus 로고
    • A general software reliability model for performance prediction
    • Shanthikumar, J. G. (1981), A general software reliability model for performance prediction, Microelectronics andd Reliability, 21 (5), 671-682.
    • (1981) Microelectronics andd Reliability , vol.21 , Issue.5 , pp. 671-682
    • Shanthikumar, J.G.1
  • 24
    • 0021006179 scopus 로고
    • S-shaped reliability growth modeling for software error detection
    • Yamada, S., Ohba, M. and Osaki, S. (1983), S-shaped reliability growth modeling for software error detection, IEEE Transactions on Reliability, R-32 (5), 475-478.
    • (1983) IEEE Transactions on Reliability , vol.R-32 , Issue.5 , pp. 475-478
    • Yamada, S.1    Ohba, M.2    Osaki, S.3
  • 25
  • 26
    • 0027559945 scopus 로고
    • Software-reliability growth with a Weibull test-effort
    • Yamada, S., Hishitani, J. and Osaki, S. (1993), Software-reliability growth with a Weibull test-effort, IEEE Transactions on Reliability, 42 (1), 100-106.
    • (1993) IEEE Transactions on Reliability , vol.42 , Issue.1 , pp. 100-106
    • Yamada, S.1    Hishitani, J.2    Osaki, S.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.