C0 coverage-measure and testing-domain metrics based on a software reliability growth model

International Journal of Reliability, Quality and Safety Engineering

Volumn 9, Issue 4, 2002, Pages 329-340

  Fujiwara, Takaji ^a   Yamada, Shigeru ^b  

^a FUJITSU LABORATORIES LTD   (Japan)

^b TOTTORI UNIVERSITY   (Japan)

Author keywords

Assessment measure; C0 coverage measure; Software reliability growth model; Testing domain rate

Indexed keywords

COMPUTER HARDWARE; EMBEDDED SYSTEMS; PROJECT MANAGEMENT; RELIABILITY;

SOFTWARE RELIABILITY;

COMPUTER AIDED SOFTWARE ENGINEERING;

EID: 0036964551     PISSN: 02185393     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218539302000871     Document Type: Article

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