Nanocrystalline zinc oxide thin films by novel double pulse single step electrodeposition

Journal of Alloys and Compounds

Volumn 495, Issue 1, 2010, Pages 76-81

  Inamdar, A I ^a,b   Sonavane, A C ^a   Sharma, S K ^b   Im, Hyunsik ^b   Patil, P S ^a  

^a SHIVAJI UNIVERSITY   (India)

^b Dongguk University   (South Korea)

Author keywords

Electrodeposition; Quartz crystal microbalance (EQCM); Transmittance electron microscopy (TEM); X ray diffractometer; Zinc oxide thin films

Indexed keywords

TEM; TRANSMITTANCE ELECTRON MICROSCOPY; X RAY DIFFRACTOMETERS; ZINC OXIDE THIN FILMS;

CONDUCTIVE FILMS; DIFFRACTION; DIFFRACTOMETERS; ELECTRODEPOSITION; NANOPARTICLES; OPTICAL PROPERTIES; OXIDE MINERALS; OXYGEN; PIEZOELECTRIC DEVICES; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

OXIDE FILMS;

EID: 77949486824     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2010.01.090     Document Type: Article

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