Surfactant-mediated growth of nanostructured zinc oxide thin films via electrodeposition and their photoelectrochemical performance

Nanotechnology

Volumn 19, Issue 32, 2008, Pages

  Inamdar, A I ^a   Mujawar, S H ^a   Ganesan, V ^a   Patil, P S ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE FILMS; COPPER PLATING; CRYSTALLITES; DIFFRACTION; DIFFUSERS (OPTICAL); ELECTRODEPOSITION; ETHANOL; ETHYLENE; ETHYLENE GLYCOL; FLUORINE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GEOPHYSICAL PROSPECTING; GLYCOLS; HOLOGRAPHIC INTERFEROMETRY; LEAKAGE (FLUID); LIGHT; LIGHT EMISSION; LITHIUM COMPOUNDS; LUMINESCENCE; METALLIC FILMS; METALLIZING; MORPHOLOGY; NANOCRYSTALLINE ALLOYS; NANOSTRUCTURED MATERIALS; NONMETALS; OPTICAL FILMS; ORGANIC POLYMERS; OXIDES; OXYGEN; OXYGEN VACANCIES; POLYETHYLENE GLYCOLS; POWDERS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SODIUM; SODIUM SULFATE; SOLIDS; SULFATE MINERALS; SURFACE ACTIVE AGENTS; SURFACE MORPHOLOGY; THICK FILMS; THIN FILMS; ZINC; ZINC ALLOYS; ZINC COMPOUNDS; ZINC OXIDE; ZINC SULFIDE;

ETHYLENE GLYCOL (PLL G PEG); FILL FACTOR (FF); FTIR STUDIES; GLASS SUBSTRATES; GRANULAR MORPHOLOGY; GREEN LIGHT; HEXAGONAL CRYSTALLITES; LUMINESCENT CENTERS; MICRO POROUS; NANO-STRUCTURED; OPTICAL (PET) (OPET); ORGANIC SURFACTANTS; PHOTO-ELECTROCHEMICAL PROPERTIES; PHOTOELECTROCHEMICAL PERFORMANCE; PHOTOVOLTAGE (PV); POLYETHYLENE GLYCOL (PEG); POLYVINYL ALCOHOL (PVOL); POLYVINYLPYRROLIDONE (PVP K 30); PURE ZNO; ROOM TEMPERATURE PHOTOLUMINESCENCE (RT-PL); SODIUM DODECYL SULFATE (SDS); SURFACTANT MOLECULES; SURFACTANT-MEDIATED GROWTH; VERTICALLY ALIGNED; X-RAY DIFFRACTION (XRD) PATTERNS; ZINC ACETATES; ZINC OXIDE THIN FILMS; ZNO THIN FILMS;

OXIDE FILMS;

DODECYL SULFATE SODIUM; ETHYLENE GLYCOL; FLUORINE; MACROGOL; NANOMATERIAL; NANOPARTICLE; POLYVINYL ALCOHOL; POVIDONE; ZINC ACETATE; ZINC OXIDE;

ARTICLE; ELECTROCHEMISTRY; PARTICLE SIZE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 47249084183     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/32/325706     Document Type: Article

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