Interfacially polymerized thin-film composite polyamide membrane: Positron annihilation spectroscopic study, characterization and pervaporation performance

Polymer Journal

Volumn 42, Issue 3, 2010, Pages 242-248

  Kao, Se Tsung ^a,b   Huang, Shu Hsien ^c   Liaw, Der Jang ^a,d   Chao, Wei Chi ^a   Hu, Chien Chieh ^e   Li, Chi Lan ^e   Wang, Da Ming ^a,b   Lee, Kueir Rarn ^a   Lai, Juin Yih ^a  

^a CHUNG YUAN CHRISTIAN UNIVERSITY   (Taiwan)

^b NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^c NATIONAL ILAN UNIVERSITY   (Taiwan)

^d NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^e NANYA INSTITUTE OF TECHNOLOGY   (Taiwan)

Author keywords

Interfacial polymerization; PAS; Pervaporation; Polyamide; TFC membrane

Indexed keywords

AFM; CHEMICAL STRUCTURE; ELEMENTAL COMPOSITIONS; FTIR-ATR SPECTROSCOPY; INTERFACIAL POLYMERIZATION; ISOPROPANOL SOLUTION; M PHENYLENEDIAMINE; PAS; PERMEATION RATE; PERVAPORATION SEPARATION; PHENYLENEDIAMINES; POLYAMIDE MEMBRANES; S PARAMETERS; SLOW-POSITRON BEAMS; SPECTROSCOPIC STUDIES; SULFONIC ACID; TRIMESOYL CHLORIDE; WATER CONCENTRATIONS; WATER CONTACT ANGLE MEASUREMENT; XPS;

ANGLE MEASUREMENT; CHLORINE COMPOUNDS; COMPOSITE MEMBRANES; CONTACT ANGLE; ELECTRONS; EVAPORATION; EXPERIMENTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROPHILICITY; POLYAMIDES; POLYMERIZATION; POLYMERS; POSITRON ANNIHILATION; POSITRON ANNIHILATION SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; THIN FILM DEVICES;

PERVAPORATION;

EID: 77949466699     PISSN: 00323896     EISSN: 13490540     Source Type: Journal    
DOI: 10.1038/pj.2009.334     Document Type: Article

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