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Volumn , Issue , 2009, Pages

High-field initiated ballistic transport in carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords


EID: 77949391044     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISDRS.2009.5378178     Document Type: Conference Paper
Times cited : (3)

References (5)
  • 1
    • 70350627408 scopus 로고    scopus 로고
    • Theory of scattering-limited and ballistic mobility and saturation velocity in low-dimensional nanostructures
    • Vijay K. Arora, "Theory of scattering-limited and ballistic mobility and saturation velocity in low-dimensional nanostructures," Current Nanoscience (CNANO), vol. 5, pp. 227-231, 2009.
    • (2009) Current Nanoscience (CNANO) , vol.5 , pp. 227-231
    • Arora, V.K.1
  • 2
    • 67650456814 scopus 로고    scopus 로고
    • Current transport modeling of carbon nanotube field effect transistors
    • A. Srivastava, J. M. Marulanda, Y. Xu, and A. K. Sharma, "Current transport modeling of carbon nanotube field effect transistors," Physica Status Solidi (a), vol. 206, pp. 1569-1578, 2009.
    • (2009) Physica Status Solidi (a) , vol.206 , pp. 1569-1578
    • Srivastava, A.1    Marulanda, J.M.2    Xu, Y.3    Sharma, A.K.4
  • 3
    • 0036713397 scopus 로고    scopus 로고
    • Low ballistic mobility in submicron HEMTs
    • M. S. Shur, "Low ballistic mobility in submicron HEMTs," IEEE Elect. Dev. Lett., vol. 23, pp. 511-513, 2002.
    • (2002) IEEE Elect. Dev. Lett , vol.23 , pp. 511-513
    • Shur, M.S.1
  • 4
    • 57349090160 scopus 로고    scopus 로고
    • Current saturation in zero-bandgap, top gated graphene field-effect transistors
    • I. Meric, M. Y. Han, A. F. Young, B. Oezyilmaz, P. Kim, and K. Shepard, "Current saturation in zero-bandgap, top gated graphene field-effect transistors," Nat. Nanotechnol., vol. 3, pp. 654-659, 2008.
    • (2008) Nat. Nanotechnol , vol.3 , pp. 654-659
    • Meric, I.1    Han, M.Y.2    Young, A.F.3    Oezyilmaz, B.4    Kim, P.5    Shepard, K.6
  • 5
    • 65249100083 scopus 로고    scopus 로고
    • The drain velocity overshoot in an 80 nm Metal-Oxide-Semiconductor Field-Effect Transistor
    • Michael L. P. Tan, Vijay K. Arora, Ismail Saad, Mohammad Taghi Ahmadi, and Razali Ismail, "The drain velocity overshoot in an 80 nm Metal-Oxide-Semiconductor Field-Effect Transistor," J. Appl. Phys., vol. 105, p. 074503, 2009.
    • (2009) J. Appl. Phys , vol.105 , pp. 074503
    • Tan, M.L.P.1    Arora, V.K.2    Saad, I.3    Taghi Ahmadi, M.4    Ismail, R.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.