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Volumn 356, Issue 18-19, 2010, Pages 911-916
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Indium tin oxide thin films for silicon-based electro-luminescence devices prepared by electron beam evaporation method
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Author keywords
Electrical and electronic properties; Electroluminescence; Films and coatings; Indium tin oxide and other transparent conductors
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Indexed keywords
DEPOSITION ATMOSPHERE;
ELECTRICAL AND ELECTRONIC PROPERTIES;
ELECTRICAL AND OPTICAL PROPERTIES;
ELECTRON BEAM EVAPORATION;
ELECTRON BEAM EVAPORATION METHODS;
ENHANCED SURFACE;
FILM MICROSTRUCTURES;
FILMS AND COATINGS;
INDIUM TIN OXIDE;
INDIUM TIN OXIDE THIN FILMS;
ITO FILMS;
ITO THIN FILMS;
OPTICAL AND ELECTRICAL PROPERTIES;
OPTICAL PERFORMANCE;
OPTICAL TRANSMITTANCE;
OPTIMIZED CONDITIONS;
OXYGEN ATMOSPHERE;
POST-ANNEALING TEMPERATURE;
SI-BASED;
SILICON-BASED;
TIN DOPED INDIUM OXIDE;
TRANSPARENT CONDUCTORS;
COATINGS;
ELECTRIC PROPERTIES;
ELECTRIC RESISTANCE;
ELECTROLUMINESCENCE;
ELECTRON BEAMS;
ELECTRONIC PROPERTIES;
EVAPORATION;
INDIUM;
LIGHT;
MAGNETIC FILMS;
OPTICAL PROPERTIES;
OXIDE FILMS;
OXYGEN;
PHOTOLITHOGRAPHY;
SEMICONDUCTING SILICON COMPOUNDS;
THIN FILMS;
TIN;
TITANIUM COMPOUNDS;
VAPORS;
ITO GLASS;
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EID: 77949324824
PISSN: 00223093
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnoncrysol.2009.12.026 Document Type: Article |
Times cited : (33)
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References (21)
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