Internal stress influence on the coercivity of FeCuNbSiB thin films

Journal of Magnetism and Magnetic Materials

Volumn 322, Issue 9-12, 2010, Pages 1275-1278

  Moulin, Johan ^a   Mazaleyrat, Frédéric ^b   Mendez, Alexandra ^a   Dufour Gergam, Elisabeth ^a  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b Centre National de la Recherche Scientifique   (France)

Author keywords

Amorphous; Finemet; Magnetic property; Nanocrystallisation; Sputtering; Thermal expansion

Indexed keywords

AMORPHOUS MATERIALS; ANISOTROPY; ANNEALING; COERCIVE FORCE; COPPER COMPOUNDS; GLASS TRANSITION; IRON COMPOUNDS; MAGNETIC PROPERTIES; NIOBIUM COMPOUNDS; SILICON COMPOUNDS; SPUTTERING; STRESS RELAXATION; THERMAL EXPANSION; X RAY DIFFRACTION;

ANNEALING TEMPERATURES; DEPOSITED MATERIALS; FINEMET; FINEMET TYPE ALLOYS; NANOCRYSTALLISATION; OPTIMAL ANNEALING; RANDOM ANISOTROPY; SQUARE-ROOT DEPENDENCE;

THIN FILMS;

EID: 77949288007     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2009.06.043     Document Type: Article

References (10)

1. Yoshizawa Y., Oguma S., and Yamauchi K. J. Appl. Phys. 64 (1988) 6044
2. Zhou Y., Zhou Z.-M., Cao Y., Gao X.-Y., and Ding W. J. Magn. Magn. Mater. (2008) 10.1016/j.jmmm.2008.04.136
3. Neuweiler A., and Kronmüller H. J. Magn. Magn. Mater. 177-181 (1998) 1269-1270
4. Sharma P., and Gupta A. J. Magn. Magn. Mater. 288 (2005) 347-353
5. Na S.M., Suh S.J., Kim H.J., and Lim S.H. J. Magn. Magn. Mater. 239 (2002) 570-572
6. Herzer G. Phys. Scr. T49 (1993) 307
7. S. Chikazumi, Physics of magnetism, Wiley.
8. Rouabhi M., Guyot M., Cagan V., and Krishnan R. IEEE Trans. Magn. 29 6 (1993)
9. Thorton J.A., Tabock J., and Hoffman D.W. Thin Solid Films 64 (1979) 111-119
10. Kane S.N., Khinchi S.S., Gercsi Z., Gupta A., Varga L.K., and Mazaleyrat F. Rev. Adv. Mater. Sci. 18 (2008) 3629-3633