Bayesian calculation of cost optimal burn-in test durations for mixed exponential populations

Reliability Engineering and System Safety

Volumn 72, Issue 3, 2001, Pages 265-273

  Perlstein, Dror ^a   Jarvis, William H ^b   Mazzuchi, Thomas A ^c  

^a RAFAEL   (Israel)

^b Office of the Secretary of Defense   (United States)

^c George Washington University   (United States)

Author keywords

Bayesian analysis; Cost optimization; Mixed exponential distribution; Screening

Indexed keywords

COMPUTATIONAL METHODS; COSTS; FAILURE ANALYSIS; MATHEMATICAL MODELS; PROBABILITY DISTRIBUTIONS; QUALITY CONTROL;

BAYESIAN ANALYSIS; BURN-IN TESTS; MIXED-EXPONENTIAL DISTRIBUTIONS;

RELIABILITY THEORY;

EID: 0035369607     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(01)00025-4     Document Type: Article

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