Atomic-scale study of plastic-yield criterion in nanocrystalline Cu at high strain rates

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 41, Issue 2, 2010, Pages 523-531

  Dongare, A M ^a   Rajendran, A M ^b   Lamattina, B ^c   Brenner, D W ^a   Zikry, M A ^a  

^a North Carolina State University   (United States)

^b UNIVERSITY OF MISSISSIPPI   (United States)

^c U S ARMY RESEARCH OFFICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ASYMMETRY PARAMETER; ATOMIC SCALE; AVERAGE GRAIN SIZE; BIAXIAL LOADING; FLOW STRESS; GRAIN SIZE; HIGH STRAIN RATES; INVERSE HALL-PETCH; LARGE-SCALE MOLECULAR DYNAMICS; MACROSCOPIC DEFORMATIONS; MACROSCOPIC YIELD; MD SIMULATION; NANOCRYSTALLINE CU; NANOCRYSTALLINE METAL; TENSION AND COMPRESSION; TENSION-COMPRESSION; TENSION-COMPRESSION ASYMMETRY; VON MISES; YIELD CRITERIA; YIELD SURFACE; Z-DIRECTIONS;

GRAIN SIZE AND SHAPE; MOLECULAR DYNAMICS; PLASTIC FLOW; THREE DIMENSIONAL;

STRAIN RATE;

EID: 77949270731     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-009-0113-x     Document Type: Article

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