Integrated experimental and modeling study of ionic conductivity of scandia-stabilized zirconia thin films

Solid State Ionics

Volumn 181, Issue 8-10, 2010, Pages 367-371

  Yu, Z Q ^a   Devanathan, R ^b   Jiang, W ^b   Nachimuthu, P ^b   Shutthanandan, V ^b   Saraf, L ^b   Wang, C M ^b   Kuchibhatla, S V N T ^b   Thevuthasan, S ^b  

^a NANJING NORMAL UNIVERSITY   (China)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

Atomistic simulation; Ionic conductivity; MBE; RBS; Sc doping; TEM; XRD; ZrO2 thin films

Indexed keywords

ATOMISTIC SIMULATION; ATOMISTIC SIMULATIONS; RBS; TEM; XRD;

COMPUTER SIMULATION; CRYSTAL GROWTH; IONIC CONDUCTIVITY; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR OXYGEN; SCANDIUM; SEMICONDUCTOR DOPING; THIN FILMS; X RAY DIFFRACTION; ZIRCONIA; ZIRCONIUM; ZIRCONIUM ALLOYS;

IONS;

EID: 77949269534     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2010.01.024     Document Type: Article

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