XPS and EIS studies of sputtered Al-Ce films formed on AA6061 aluminum alloy in 3.5% NaCl solution

Journal of Applied Electrochemistry

Volumn 40, Issue 3, 2010, Pages 639-651

  Dominguez Crespo M A ^a   Torres Huerta, A M ^a   Rodil, S E ^c   Brachetti Sibaja, S B ^b   De La Cruz, W ^d   Flores Vela, A ^a  

^a INSTITUTO POLITÉCNICO NACIONAL   (Mexico)

^b Alumna PTA CICATA Altamira IPN   (Mexico)

^c INSTITUTO DE INVESTIGACIONES EN MATERIALES   (Mexico)

^d UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

AA6061; Al Ce films; Coatings; Corrosion properties; Magnetron sputtering

Indexed keywords

3.5 WT% NACL SOLUTION; 3.5%NACL; AA6061; AGGRESSIVE MEDIUM; AMBIENT CONDITIONS; BARRIER PROPERTIES; BEFORE AND AFTER; CERIUM OXIDES; CHEMICAL COMPOSITIONS; CONTROLLED DIFFUSION; CORROSION PROPERTIES; CORROSION PROPERTY; DEPOSITION PARAMETERS; EIS STUDIES; ELECTROCHEMICAL CHARACTERIZATIONS; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY MEASUREMENTS; EXPOSURE-TIME; TRANSPORT PHENOMENA; VISIBLE CRACKS; XPS;

ALUMINUM; ALUMINUM ALLOYS; CERIUM; CERIUM COMPOUNDS; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTROCHEMICAL PROPERTIES; MAGNETRONS; OXIDE FILMS; PROTECTIVE COATINGS; SODIUM CHLORIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

ALUMINUM COATINGS;

EID: 77949265987     PISSN: 0021891X     EISSN: None     Source Type: Journal    
DOI: 10.1007/s10800-009-0039-4     Document Type: Article

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