Microstructural and electrochemical characterization of Ce conversion layers formed on Al alloy 2024-T3 covered with Cu-rich smut

Electrochimica Acta

Volumn 51, Issue 26, 2006, Pages 5943-5953

  Palomino, Luis E M ^a   Aoki, Idalina V ^a   de Melo, Hercílio G ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Al 2024 T3; Cerium; Conversion layers; Cr free pre treatments; EIS

Indexed keywords

CERIUM; CORROSION; ELECTROCHEMISTRY; MICROSTRUCTURE; NUCLEATION; PRECIPITATION (CHEMICAL); SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; SURFACE CHEMISTRY;

AL 2024-T3; CONVERSION LAYERS; CR-FREE PRE-TREATMENTS; EIS;

ALUMINUM ALLOYS;

EID: 33746828202     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2006.03.036     Document Type: Article

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