Hot pixel reduction in CMOS image sensor pixels

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7537, Issue , 2010, Pages

  Yu, Jonathan ^a   Collins, David J ^a   Yasan, Alireza ^a   Bae, Sanghoon ^a   Ramaswami, Shri ^a  

^a Foveon Inc   (United States)

Author keywords

CIS; CMOS image sensor pixels; Electric field; Foveon; Hot pixel reduction; Process optimization; TCAD

Indexed keywords

CIS; CMOS IMAGE SENSOR; FULL SCALE; GOOD CORRELATIONS; HOT PIXELS; P-N JUNCTION; POLYSILICON GATES; PROCESS LEVELS; PROCESS OPTIMIZATION; REDUCTION PROCESS; TECHNIQUES USED; TECHNOLOGY COMPUTER AIDED DESIGN;

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; DIGITAL CAMERAS; DIGITAL IMAGE STORAGE; ELECTRIC FIELD MEASUREMENT; ELECTRIC FIELDS; IMAGE PROCESSING; IMAGE SENSORS; OPTIMIZATION; PHOTODIODES; PHOTOGRAPHY; POLYSILICON; PROCESS CONTROL; SEMICONDUCTOR JUNCTIONS;

PIXELS;

EID: 77749341585     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.839118     Document Type: Conference Paper

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