Morphology controlled surface-assisted self-assembled microtube junctions and dendrites of metal free porphyrin-based semiconductor

Langmuir

Volumn 26, Issue 5, 2010, Pages 3678-3684

  Ma, Pan ^a   Chen, Yanli ^c   Bian, Yongzhong ^a   Jiang, Jianzhuang ^a,b  

^a SHANDONG UNIVERSITY   (China)

^b UNIVERSITY OF SCIENCE AND TECHNOLOGY BEIJING   (China)

^c UNIVERSITY OF JINAN   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION BAND; CHLOROFORM VAPOR; CORRESPONDING SOLUTIONS; DROP-CAST; ELECTRONIC ABSORPTION; GAS RESPONSE CHARACTERISTICS; HYDROPHOBIC INTERACTIONS; INTERMOLECULAR INTERACTIONS; IR AND UV-VIS SPECTROSCOPIES; J AGGREGATES; METAL-FREE PORPHYRIN; MICROTUBE; MOLECULAR ORDERING; MOLECULAR PACKINGS; MORPHOLOGY-CONTROLLED; N-HEXANE; NANO-TUBULAR STRUCTURE; Q BANDS; SELF ASSEMBLY PROCESS; SELF-ASSEMBLED; SELF-ASSEMBLED MICROSTRUCTURES; SELF-ASSEMBLING PROPERTIES; SEM; SIDE CHAINS; SOLVENT-SOLUTE INTERACTIONS; SPECTROSCOPIC DATA; VAN DER WAALS INTERACTIONS; VAPOR ANNEALING; XRD;

ABSORPTION SPECTROSCOPY; AGGREGATES; ASSEMBLY; CHLORINE COMPOUNDS; GAS ABSORPTION; HEXANE; HYDROPHOBICITY; MICROMETERS; MICROSTRUCTURE; NEURONS; OXIDE MINERALS; PORPHYRINS; QUARTZ; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTOR JUNCTIONS; SILICON COMPOUNDS; SOLVENTS; ULTRAVIOLET SPECTROSCOPY; VAN DER WAALS FORCES; VAPORS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

DENDRITES (METALLOGRAPHY);

PORPHYRIN;

ABSORPTION; ARTICLE; CHEMISTRY; ELECTRON; INFRARED SPECTROPHOTOMETRY; SEMICONDUCTOR; SURFACE PROPERTY; X RAY DIFFRACTION;

ABSORPTION; ELECTRONS; PORPHYRINS; SEMICONDUCTORS; SPECTROPHOTOMETRY, INFRARED; SURFACE PROPERTIES; X-RAY DIFFRACTION;

EID: 77749319295     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la903141t     Document Type: Article

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