High-brightness water-window electron-impact liquid-jet microfocus source

Applied Physics Letters

Volumn 96, Issue 8, 2010, Pages

  Skoglund, P ^a   Lundstrom U ^a   Vogt, U ^a   Hertz, H M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-IMPACT; HIGH BRIGHTNESS; JET INSTABILITY; LIMITING FACTORS; LIQUID-JET; MONTE CARLO; ORDERS OF MAGNITUDE; OXYGEN LINE; QUANTITATIVE AGREEMENT; SOFT X-RAY SOURCES; TABLE-TOP; WATER JETS; X RAY MICROSCOPY; X-RAY POWER;

ELECTRON BEAMS; OXYGEN;

LEAKAGE (FLUID);

EID: 77749292089     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3310281     Document Type: Article

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