Compositional dependence of structure and dielectric properties in Ba(ZrxTi1-x)O3 thin films grown by pulsed laser deposition

Ferroelectrics

Volumn 387, Issue 1 PART 1, 2009, Pages 63-69

  Yun, P ^a   Wang, D Y ^a   Wang, Y ^a   Chan, H L W ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Barium zirconate titanate; Thin films; Tunable; Zr Ti ratio

Indexed keywords

COMPOSITIONAL DEPENDENCE; DISTORTED LATTICES; EPITAXIALLY GROWN; IN-PLANE; ROOM TEMPERATURE; SINGLE CRYSTAL SUBSTRATES; TUNABILITIES; TUNABLE; TUNABLE MICROWAVE DEVICES; X-RAY DIFFRACTION MEASUREMENTS; ZR/TI RATIO;

BARIUM; BARIUM ZIRCONATE; DEPOSITION; DIELECTRIC PROPERTIES; MICROWAVE DEVICES; MICROWAVE MEASUREMENT; MICROWAVES; PULSED LASER DEPOSITION; PULSED LASERS; SINGLE CRYSTALS; THIN FILMS; X RAY DIFFRACTION; ZIRCONIUM;

BARIUM TITANATE;

EID: 77749286174     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150190902966354     Document Type: Conference Paper

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