Chemical and geometrical criteria for the release of elastomeric ID nanoarrays from porous nanotemplates

Langmuir

Volumn 26, Issue 5, 2010, Pages 3252-3256

  Lee, Dong Yun ^a   Lee, Dae Ho ^a   Lim, Ho Sun ^a   Han, Joong Tark ^a   Cho, Kilwon ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION ENERGY; COMBINED EFFECT; CONTACT AREAS; GEOMETRIC FEATURE; IMPRINT LITHOGRAPHY; KEY FACTORS; NANOARRAYS; NANOPOROUS TEMPLATES; NANOTEMPLATES; NEW APPLICATIONS; PORE LENGTH; POROUS TEMPLATES; REAL CONTACT AREA; RUPTURE CONDITIONS; SIMPLE EXPRESSION; SOFT LITHOGRAPHY; SOFT MATERIAL; SURFACE ENERGIES; UPPER LIMITS;

ADHESION; LITHOGRAPHY; PRESSURE DROP; SURFACE CHEMISTRY; SURFACE DEFECTS; SURFACE TENSION;

ASPECT RATIO;

BAYSILON; DIMETICONE; ELASTOMER;

ARTICLE; CHEMISTRY; INSTRUMENTATION; MECHANICS; NANOTECHNOLOGY; POROSITY; SURFACE PROPERTY;

DIMETHYLPOLYSILOXANES; ELASTOMERS; MECHANICAL PROCESSES; NANOTECHNOLOGY; POROSITY; SURFACE PROPERTIES;

EID: 77749255896     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9029936     Document Type: Article

References (20)

1. Jeon, S.; Park, J. U.; Cirelli, R.; Yang, S.; Heitzman, C. E.; Braun, P. V.; Kenis, P. J. A.; Rogers, J. A. Proc. Natl. Acad. Sci. U.S.A. 2004, 101, 12428-12433.
2. McDonald, J. C.; Whitesides, G. M. Acc. Chem. Res. 2002, 35, 491-499.
3. Park, T. H.; Shuler, M. L. Biotechnol. Prog. 2003, 19, 243-253.
4. Mahdavi, A.; Ferreira, L.; Sundback, C.; Nichol, J. W.; Chan, E. P.; Carter, D. J. D.; Bettinger, C. J.; Patanavanich, S.; Chignozha, L.; Ben-Joseph, E.; Galakatos, A.; Pryor, H.; Pomerantseva, I.; Masiakos, P. T.; Faquin, W.; Zumbuehl, A.; Hong, S.; Borenstein, J.; Vacanti, J.; Langer, R.; Karp, J. M. Proc. Natl. Acad. Sci. U.S.A. 2008, 105, 2307-2312.
5. McAllister, D. V.; Wang, P. M.; Davis, S. P.; Park, J. H.; Canatella, P. J.; Allen, M. G.; Prausnitz, M. R. Proc. Natl. Acad. Sci. U.S.A. 2003, 100, 13755-13760.
6. Tan, J. L.; Tien, J.; Pirone, D. M.; Gray, D. S.; Bhadriraju, K.; Chen, C. S. Proc. Natl. Acad. Sci. U.S.A. 2003, 100, 1484-1489.
7. Grimm, S.; Schwirn, K.; Goring, P.; Knoll, H.; Miclea, P. T.; Greiner, A.; Wendorff, J. H.; Wehrspohn, R. B.; Gosele, U.; Steinhart, M. Small 2007, 3, 993-1000.
8. Odom, T. W.; Love, J. C.; Wolfe, D. B.; Paul, K. E.; Whitesides, G. M. Langmuir 2002, 18, 5314-5320.
9. Holgerson, P.; Sutherland, D. S.; Kasemo, B.; Chakarov, D. Appl. Phys. A 2005, 81, 51-56.
10. Fox, H. W.; Hare, E. F.; Zisman, W. A. J. Phys. Chem. 1955, 59, 1097-1106.
11. Greiner, C.; del Campo, A.; Arzt, E. Langmuir 2007, 23, 3495-3502.
12. Israelachvili, J. Intermolecular and Surface Forces, 2nd ed.; Academic Press: London, 1991.
13. Jung, G. Y.; Li, Z. Y.; Wu, W.; Ganapathiappan, S.; Li, X. M.; Olynick, D. L.; Wang, S. Y.; Tong, W. M.; Williams, R. S. Langmuir 2005, 21, 6127-6130.
14. Chan, E. P.; Crosby, A. J. J. Vac. Sci. Technol., B 2006, 24, 2716-2722.
15. Lee, D. H.; Oh, T.; Cho, K. J. Phys. Chem. B 2005, 109, 11301-11306.
16. Chen, Y. L.; Helm, C. A.; Isralachvili, J. N. J. Phys. Chem. 1991, 95, 10736.
17. Lee, D. H.; Kim, D.; Oh, T.; Cho, K. Langmuir 2004, 20, 8124-8130.
18. Masuda, H.; Satoh, M. Jpn. J. Appl. Phys. 1996, 35, L126.
19. Roca-Cusachs, P.; Rico, F.; Martinez, E.; Toset, J.; Farre, R.; Navajas, D. Langmuir 2005, 21, 5542-5548.
20. Zhang, Y.; Lo, C. W.; Taylor, J. A.; Yang, S. Langmuir 2006, 22, 8595-8601.