Visibility and Raman spectroscopy of mono and bilayer graphene on crystalline silicon

Applied Physics Letters

Volumn 96, Issue 8, 2010, Pages

  Song, Emil B ^a   Lian, Bob ^a   Xu, Guangyu ^a   Yuan, Bo ^b   Zeng, Caifu ^a   Chen, Amber ^a   Wang, Minsheng ^a   Kim, Sungmin ^a   Lang, Murong ^a   Zhou, Yi ^a   Wang, Kang L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b Engineering IV   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BI-LAYER; BURIED OXIDES; CRYSTALLINE SI; CRYSTALLINE SILICONS; DIELECTRIC SUBSTRATES; ENHANCEMENT EFFECTS; EXPERIMENTAL STUDIES; GRAPHENE DEVICES; HIGH CONTRAST; HIGH-THROUGHPUT METHOD; MONOCHROMATIC ILLUMINATION; OPTICAL MICROSCOPES; RAMAN SPECTRUM; SEMICONDUCTOR SYSTEMS; SI SURFACES; SILICON ON INSULATOR WAFERS;

CRYSTALLINE MATERIALS; DIELECTRIC MATERIALS; GRAPHENE; GRAPHITE; OPTICAL MICROSCOPY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILICON OXIDES; SUBSTRATES;

SILICON WAFERS;

EID: 77749246114     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3323105     Document Type: Article

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