Reducing the EMI susceptibility of a Kuijk bandgap

IEEE Transactions on Electromagnetic Compatibility

Volumn 50, Issue 4, 2008, Pages 876-886

  Orietti, Enrico ^a   Montemezzo, Nicola ^b   Buso, Simone ^a   Meneghesso, Gaudenzio ^a   Neviani, Andrea ^a   Spiazzi, Giorgio ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b Canova Tech Srl   (Italy)

Author keywords

Differential pair distortion; Kuijk bandgap; Rectification; RF interference; Stray components

Indexed keywords

BANDPASS AMPLIFIERS; BIPOLAR TRANSISTORS; DEGRADATION; ELECTRIC NETWORK ANALYSIS; ELECTRIC POWER DISTRIBUTION; ELECTRIC POWER TRANSMISSION NETWORKS; ELECTRIC POWER UTILIZATION; ELECTRIC RECTIFIERS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC WAVES; OPERATIONAL AMPLIFIERS; SPICE; TRANSISTORS; VOLTAGE MEASUREMENT;

DIFFERENTIAL PAIR DISTORTION; KUIJK BANDGAP; RECTIFICATION; RF INTERFERENCE; STRAY COMPONENTS;

ENERGY GAP;

EID: 57049169701     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEMC.2008.2004581     Document Type: Article

References (12)

1. M. Citron, M. Corradin, S. Buso, G. Spiazzi, and F. Fiori, "Susceptibility of integrated circuits to RFI: Analysis of PWM current-mode controllers for SMPS," in Proc. IEEE 28th Annu. Conf. Ind. Electron. Soc. (IECON 2002), vol. 4, pp. 3227-3231.
2. F. Fiori, "Prediction of RF interferences effects in smart power integrated circuits," in Proc. Int. Symp. Electromagn. Compat., Washington, DC, Aug. 2000, pp. 345-347.
3. G. Masetti, G. Setti, and N. Speciale, "On the key role of parasitic capacitances in the determination of susceptibility to EMI of integrated operational amplifiers," presented at the Int. Symp. Electromagn. Compat. (EMC), Zurich, Switzerland, 1999.
4. F. Fiori and P. S. Crovetti, "Nonlinear effects of radio-frequency interference in operational amplifiers," IEEE Trans. Circuits Syst. I, vol. 49, no. 3, pp. 367-372, Mar. 2002.
5. A. Pretelli, A. Richelli, L. Colalongo, and Z. M. Kovacs-Vajna, "Robust design of bandgap voltage references with low EMI susceptibility," in Proc. IEEE Int. Symp. Electromagn. Compat., Aug. 2003, vol. 1, pp. 298-302.
6. A. Pretelli, A. Richelli, L. Colalongo, and Z.M. Kovacs-Vajna, "Reduction of EMI susceptibility in CMOS bandgap reference circuits," IEEE Trans. Electromagn. Compat., vol. 48, no. 4, pp. 760-765, Nov. 2006.
7. F. Fiori and P. S. Provetti, "Investigation on EMI effects in bandgap voltage references," in Proc. Int. Workshop EMC (CEM COMPO), Toulouse, France, Nov. 2002, pp. 35-39.
8. M. Corradin, G. Spiazzi, and S. Buso, "Effects of RFI and underground currents on a smart power bandgap voltage reference," presented at the Int. Symp. Electromagn. Compat. - EMC Europe, Eindhoven, The Netherlands, Sep. 2004.
9. K. E. Kuijk, "A precision reference voltage source," IEEE J. Solid-State Circuits, vol. 8, no. 3, pp. 222-226, Jun. 1973.
10. IEC. (2006, Jan.). IEC62132, Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz, [Online]. Available: www.iec.ch
11. V. Pozzolo, P. Tenti, F. Fiori, G. Spiazzi, and S. Buso, "Susceptibility of integrated circuits to RFI," in Proc. CPES Annu. Semin., Blacksburg, VA, Apr. 2002, vol. 1, pp. 10-15.
12. M. Corradin, G. Spiazzi, and S. Buso, "Effects of radio frequency interefernce in opamp differential input stages," presented at the Int. Symp. Electromagn. Compat., Chicago, IL, vol. 3, 2005.