Precise analysis of the surface oxidation layer on Cu powders using FE-TEM techniques

Journal of Korean Institute of Metals and Materials

Volumn 48, Issue 1, 2010, Pages 57-61

  Lee, Tae Hun ^a,d   Yoo, Jung Ho ^a   Hyun, Moon Seop ^a   Yang, Jun Mo ^a   Seong, Mi Ryn ^b   Kwon, Jinhyeong ^b   Lee, Caroline Sunyong ^b   Kim, Jeong Sun ^c   Baik, Kyeong Ho ^d  

^a National Nano Fab Center (NNFC)   (South Korea)

^b Hanyang University   (South Korea)

^c Agency for Defence Development   (South Korea)

^d Chungnam National University   (South Korea)

Author keywords

Cu powder; Electron energy loss spectroscopy; Field emission transmission electron microscope; High resolution transmission electron microscopy; Surface oxidation

Indexed keywords

EID: 77649103822     PISSN: 17388228     EISSN: None     Source Type: Journal    
DOI: 10.3365/KJMM.2010.48.01.057     Document Type: Article

References (8)

1. K. L. Klug, V. P. Dravid, and D. L. Johnson, J. Mater. Res. 18, 988 (2003).
2. N. A. Dhas, C. P. Faj, and A. Fedanken, Chem. Mater. 10, 1446(1998).
3. Y.-H. Guo, B.-B. Jiang, J.-Z. Chen, and S.-J. Zhang, Surface & Coatings Technology 202, 555 (2007).
4. S. Poulston, P. M. Parlett, P. Stone, and M. Bowker, Surface and Interface Analysis 24, 811 (1996).
5. J.-W. Lim, J. Iijima, Y. Zhu, J. H. Yoo, G-S. Choi, K. Mimura, and M. Isshiki, Thin Solid Films 516, 4040 (2008).
6. J.-M. Yang, J.-C. Park, Y.-B. Park, J.-J. Kim, T.-S. Back, H.-S. Lee, S.-Y Lee, and S.-W. Park, Journal of Electron Microscopy 52, 305 (2003).
7. K. H. Kim, J. M. Yang, C. W. Ahn, H. S. Seo, I.-S. Kang, and W.-J. Hwang, J. Kor. Inst. Met. & Mater. 46, 458 (2008).
8. M. M. Disko, C. C. Ahn, and B. Fultz, Transmission Electron Energy Loss Spectrometry in Materials Science, p. 264-265, A Publication of The Minerals • Metals & Materials Society (1992).