Reliability of nonhermetic bias-free LiNbO3 modulators

IEEE Photonics Technology Letters

Volumn 16, Issue 11, 2004, Pages 2457-2459

  Nagata, Hirotoshi ^a   Li, Yagang ^a   Voisine, Kenneth R ^a   Bosenberg, Walter R ^a  

^a JDS Uniphase Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DEGRADATION; DETERIORATION; ESTIMATION; FAILURE (MECHANICAL); HEATING; INSERTION LOSSES; ION EXCHANGE; LITHIUM NIOBATE; OPTICAL WAVEGUIDES; PROTONS; RELIABILITY;

DAMP HEAT CONDITIONS; DEVICE PERFORMANCE; FAILURE RATE; GLUED FIBER JOINTS; HUMIDITY INDUCED DETERIORATION; NONHERMETIC BIAS FREE MODULATORS; PROTON EXCHANGE; TEMPERATURE ACTIVATION;

LIGHT MODULATORS;

EID: 7744222142     PISSN: 10411135     EISSN: None     Source Type: Journal    
DOI: 10.1109/LPT.2004.834927     Document Type: Article

References (8)

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