DNA mismatch detection by metal ion enhanced impedance analysis

Chinese Journal of Physics

Volumn 47, Issue 5, 2009, Pages 740-747

  Jangjian, Peng Chung ^a   Liu, Tzeng Feng ^a   Tsai, Chuan Mei ^b   Li, Mei Yi ^a,b   Tsai, Ming Shih ^c   Tseng, Shin Hua ^a   Cheng, Tsai Mu ^a   Chang, Chia Ching ^a,d  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^b NATIONAL NANO DEVICE LABORATORIES   (Taiwan)

^c Cabot Microelectronic ^*  (Taiwan)

^d INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77349091342     PISSN: 05779073     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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