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Volumn 17, Issue 2, 2010, Pages 250-256
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X-ray microdiffraction analysis of radiation-induced defects in single grains of polycrystalline Fe
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Author keywords
Diffuse scattering; Irradiation; Microdiffraction
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Indexed keywords
AREA DETECTORS;
DIFFUSE SCATTERING;
DIFFUSE X-RAY SCATTERING;
MICRODIFFRACTIONS;
MICROMETER-SCALE;
POLYCRYSTALLINE;
RADIATION INDUCED DEFECTS;
REAL-SPACE;
RECIPROCAL SPACE;
SENSITIVE AREA;
SIGNAL TO NOISE;
SINGLE GRAINS;
SPACE VOLUME;
X RAY BEAM;
X-RAY ENERGIES;
X-RAY MICRODIFFRACTION ANALYSIS;
DEFECTS;
DIFFRACTION;
IRRADIATION;
X RAY OPTICS;
X RAY SCATTERING;
SCATTERING;
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EID: 77249156033
PISSN: 09090495
EISSN: 16005775
Source Type: Journal
DOI: 10.1107/S0909049509052078 Document Type: Article |
Times cited : (4)
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References (19)
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