-
1
-
-
0007833007
-
-
Basko, D. M.; Agranovich, V. M.; Bassani, F.; La Rocca, G. C. Eur. Phys. J. B 2000, 13, 653.
-
(2000)
Eur. Phys. J. B
, vol.13
, pp. 653
-
-
Basko, D.M.1
Agranovich, V.M.2
Bassani, F.3
La Rocca, G.C.4
-
2
-
-
10044283191
-
-
Anni, M.; Valerini, D.; Manna, L.; Cretl, A.; Cingolani, R.; Lomascolo, M. Appl. Phys. Lett. 2004, 85, 4169.
-
(2004)
Appl. Phys. Lett.
, vol.85
, pp. 4169
-
-
Anni, M.1
Valerini, D.2
Manna, L.3
Cretl, A.4
Cingolani, R.5
Lomascolo, M.6
-
3
-
-
77249155154
-
-
Anni, M.; Valerini, D.; Manna, L.; Cretl, A.; Cingolani, R.; Lomascolo, M. Appl. Phys. Lett. 2006, 88, 259-901.
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 259-901
-
-
Anni, M.1
Valerini, D.2
Manna, L.3
Cretl, A.4
Cingolani, R.5
Lomascolo, M.6
-
4
-
-
33845355747
-
-
Blumstengel, S.; Sadofev, S.; Xu, C.; Puis, J.; Henneberger, F. Phvs. Rev. Lett. 2006, 97, 237401.
-
(2006)
Phvs. Rev. Lett.
, vol.97
, pp. 237401
-
-
Blumstengel, S.1
Sadofev, S.2
Xu, C.3
Puis, J.4
Henneberger, F.5
-
5
-
-
32244449258
-
-
Heliotis, G.; Itskos, G.; Murray, R.; Dawson, M. D.; Watson, I. M.; Bradley, D. D. C. Adv. Mater. 2006, 18, 334.
-
(2006)
Adv. Mater.
, vol.18
, pp. 334
-
-
Heliotis, G.1
Itskos, G.2
Murray, R.3
Dawson, M.D.4
Watson, I.M.5
Bradley, D.D.C.6
-
7
-
-
47749104506
-
-
Chin, P. T. K.; Hikmet, R. A. M.; Janssen, R. A. J. J Appl. Phys. 2008, 104, 013108.
-
(2008)
J Appl. Phys.
, vol.104
, pp. 013108
-
-
Chin, P.T.K.1
Hikmet, R.A.M.2
Janssen, R.A.J.3
-
8
-
-
0001544549
-
-
Greenham, N. C.; Peng, X.; Alivisatos, A. P. Phvs. Rev. B 1996, 54, 17628.
-
(1996)
Phvs. Rev. B
, vol.54
, pp. 17628
-
-
Greenham, N.C.1
Peng, X.2
Alivisatos, A.P.3
-
9
-
-
10144224985
-
-
Hide, F.; Diaz Garcia, M.. A.; Schwartz, B. J.; Andersson, M. R.; Pei, Q. B.; Heeger, A. J. Science 1996, 273, 1833.
-
(1996)
J. Science
, vol.273
, pp. 1833
-
-
Hide, F.1
Diaz Garcia, M.A.2
Schwartz, B.J.3
Andersson, M.R.4
Pei, Q.B.5
Heeger, A.6
-
13
-
-
0034926345
-
-
Scherf, U.; Riechel, S.; Lemmer, U.; Mahrt, R. F. Curr. Opin. Solid State Mater. Sci 2001, 5, 143.
-
(2001)
Curr. Opin. Solid State Mater. Sci
, vol.5
, pp. 143
-
-
Scherf, U.1
Riechel, S.2
Lemmer, U.3
Mahrt, R.F.4
-
15
-
-
32244449258
-
-
Heliotis, G.; Itskos, G.; Murray, R.; Dawson, M. D.; Watson, I. M.; Bradley, D. D. C. Adv. Mater. 2006, 18, 334.
-
(2006)
Adv. Mater.
, vol.18
, pp. 334
-
-
Heliotis, G.1
Itskos, G.2
Murray, R.3
Dawson, M.D.4
Watson, I.M.5
Bradley, D.D.C.6
-
16
-
-
0037603819
-
-
Reiss, P.; Bleuse, J.; Pron, A. Nano Lett. 2002, 2, 781.
-
(2002)
Nano Lett.
, vol.2
, pp. 781
-
-
Reiss, P.1
Bleuse, J.2
Pron, A.3
-
17
-
-
34248592366
-
-
Tamborra, M.; Striccoli, M.; Curri, M. L.; Alducin, J. A.; Mecerreyes, D.; Pomposo, J. A.; Kehagias, N.; Reboud, V.; Sotomayor Torres, C. M.; Agostiano, A. Small 2007, 3, 822.
-
(2007)
Small
, vol.3
, pp. 822
-
-
Tamborra, M.1
Striccoli, M.2
Curri, M.L.3
Alducin, J.A.4
Mecerreyes, D.5
Pomposo, J.A.6
Kehagias, N.7
Reboud, V.8
Sotomayor Torres, C.M.9
Agostiano, A.10
-
19
-
-
0037816199
-
-
Yu, W. W.; Qu, L.; Guo, W.; Peng, X. Chem. Mater. 2003, 15, 2854.
-
(2003)
Chem. Mater.
, vol.15
, pp. 2854
-
-
Yu, W.W.1
Qu, L.2
Guo, W.3
Peng, X.4
-
20
-
-
0037826856
-
-
Ariu, M.; Sims, M.; Rahn, M. D.; Hill, J.; Fox, A. M.; Lidzey, D. G.; Oda, M.; Cabanillas-Gonzalez, J.; Bradley, D. D. C. Phys. Rev. B 2003, 67, 195333.
-
(2003)
Phys. Rev. B
, vol.67
, pp. 195333
-
-
Ariu, M.1
Sims, M.2
Rahn, M.D.3
Hill, J.4
Fox, A.M.5
Lidzey, D.G.6
Oda, M.7
Cabanillas-Gonzalez, J.8
Bradley, D.D.C.9
-
21
-
-
0034635390
-
-
Klimov, V. I.; Mikhailovsky, A. A.; McBranch, D. W.; Leatherdale, C. A.; Bawendi, M. G. Science 2000, 287, 1011.
-
(2000)
Science
, vol.287
, pp. 1011
-
-
Klimov, V.I.1
Mikhailovsky, A.A.2
McBranch, D.W.3
Leatherdale, C.A.4
Bawendi, M.G.5
-
22
-
-
77249154053
-
-
The relative error on the PL intensity has been, estimated by repeating, for any acquisition condition, 60 times the measurement and determining the standard deviation of the intensity distribution. The obtained results indicate that the relative error on the intensity values is in the range 0.8-3.7% for all the acquisition conditions.
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The relative error on the PL intensity has been, estimated by repeating, for any acquisition condition, 60 times the measurement and determining the standard deviation of the intensity distribution. The obtained results indicate that the relative error on the intensity values is in the range 0.8-3.7% for all the acquisition conditions.
-
-
-
-
23
-
-
28444440606
-
-
Valerini, D.; Creti, A.; Lomascolo, M.; Manna, L.; Cingolani, R.; Anni, M. Phys. Rev. B 2005, 71, 235409.
-
(2005)
Phys. Rev. B
, vol.71
, pp. 235409
-
-
Valerini, D.1
Creti, A.2
Lomascolo, M.3
Manna, L.4
Cingolani, R.5
Anni, M.6
-
24
-
-
77249162182
-
-
ncγ - 8y.
-
ncγ - 8y.
-
-
-
-
25
-
-
0037094550
-
-
Kallinger, C.; Riechel, S.; Holderer, O.; Lemmer, U.; Feldmann, J.; Berieb, S.; Mückl, A. G.; Brütting, W. J. Appl. Phys. 2002, 91, 6367.
-
(2002)
J. Appl. Phys.
, vol.91
, pp. 6367
-
-
Kallinger, C.1
Riechel, S.2
Holderer, O.3
Lemmer, U.4
Feldmann, J.5
Berieb, S.6
Mückl, A.G.7
Brütting, W.8
-
28
-
-
33749248481
-
-
Kobayashi, T.; Flämmich, M.; Jordan, G.; D'Arcy, R.; Rüther, M.; Blau, W. J.; Suzuki, Y.; Kaino, T. Appl. Phys. Lett. 2006, 89, 131119.
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 131119
-
-
Kobayashi, T.1
Flämmich, M.2
Jordan, G.3
D'Arcy, R.4
Rüther, M.5
Blau, W.J.6
Suzuki, Y.7
Kaino, T.8
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