Limits on integration as determined by power dissipation and signal-to-noise ratio in loss-compensated photonic integrated circuits based on metal/quantum-dot materials

IEEE Journal of Quantum Electronics

Volumn 46, Issue 4, 2010, Pages 518-524

  Thylén, Lars ^a,b   Holmström, Petter ^a   Bratkovsky, Alexander ^b   Li, Jingjing ^b   Wang, Shih Yuan ^b  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b HEWLETT PACKARD LABORATORIES   (United States)

Author keywords

Amplifier noise; Gain; Photonic integration; Plasmonics; Quantum dots

Indexed keywords

AMPLIFIER NOISE; AUGER RECOMBINATION; DISSIPATIVE LOSS; LOW-POWER DISSIPATION; METAL STRUCTURES; NEGATIVE DIELECTRIC; PHOTONIC INTEGRATED CIRCUITS; PHOTONIC INTEGRATIONS; PLASMONICS; POWER DISSIPATION; QUANTUM DOT;

EMBEDDED SYSTEMS; NANOPHOTONICS; OPTICAL WAVEGUIDES; PLASMONS; SIGNAL TO NOISE RATIO;

SEMICONDUCTOR QUANTUM DOTS;

EID: 77249112741     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2009.2036743     Document Type: Article

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