Nanometer-scale embossing of polydimethylsiloxane

Langmuir

Volumn 26, Issue 4, 2010, Pages 2187-2190

  Hoh, Maria ^a   Werbin, Jeffrey L ^a   Dumas, Julie K ^a   Heinz, William F ^a   Hoh, Jan H ^a  

^a JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-PASS FILTERING; LOW PRESSURES; NANO-METER-SCALE; PLASTIC PROPERTY; POLYDIMETHYLSILOXANE PDMS; ROOM TEMPERATURE; SURFACE CHARACTERIZATION; SURFACE FEATURE;

ATOMIC FORCE MICROSCOPY; BIOLOGY; MICROCHANNELS; SURFACES;

SILICONES;

BAYSILON; DIMETICONE; NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; PARTICLE SIZE; PRESSURE; SURFACE PROPERTY; TEMPERATURE;

DIMETHYLPOLYSILOXANES; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES; PARTICLE SIZE; PRESSURE; SURFACE PROPERTIES; TEMPERATURE;

EID: 77149166652     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la9029886     Document Type: Article

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