Wettability Techniques to Monitor the Cleanliness of Surfaces

Developments in Surface Contamination and Cleaning - Fundamentals and Applied Aspects

Volumn , Issue , 2008, Pages 693-723

  Birch, William ^a   Carré, Alain ^b   Mittal, Kashmiri L ^c  

^a INSTITUTE OF MATERIALS RESEARCH AND ENGINEERING   (Singapore)

^b Corning European Technology Center ^*  (France)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77149135935     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-081551555-5.50015-0     Document Type: Chapter

References (36)

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