Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy

Microelectronic Engineering

Volumn 87, Issue 5-8, 2010, Pages 802-805

  Kitsara, M ^a,b   Petrou, P ^c   Kontziampasis, D ^a,b   Misiakos, K ^a   Makarona, E ^a   Raptis, I ^a,d   Beltsios, K ^b  

^a INSTITUTE OF MICROELECTRONICS   (Greece)

^b UNIVERSITY OF IOANNINA   (Greece)

^c INSTITUTE OF NANOSCIENCE AND NANOTECHNOLOGY   (Greece)

^d ThetaMetrisis   (Greece)

Author keywords

Atomic force microscopy; Biomolecular layer; Gamma globulins; Reflectance spectroscopy

Indexed keywords

BIOMOLECULAR LAYERS; BIOMOLECULES IMMOBILIZATION; GAMMA-GLOBULINS; REFLECTANCE SPECTROSCOPY; SOLID SURFACE; THICKNESS DETERMINATION; WHITE LIGHT;

ADSORPTION; ATOMIC FORCE MICROSCOPY; ATOMS; BIOMOLECULES; REFLECTION;

ATOMIC SPECTROSCOPY;

EID: 77149120446     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.11.082     Document Type: Article

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