Method for improved secondary ion yields in cluster secondary ion mass spectrometry

Rapid Communications in Mass Spectrometry

Volumn 24, Issue 5, 2010, Pages 593-598

  Brewer, Tim M ^a   Szakal, Christopher ^a   Gillen, Greg ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; GLYCEROL; IODINE COMPOUNDS; ION BEAMS; IONS; MOLECULES; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY;

ANALYTES; CONDITION; DYNAMIC SECONDARY ION MASS SPECTROMETRY; INK JET; ORGANIC MOLECULES; PRIMARY IONS; PRINTED ARRAYS; SECONDARY ION YIELD; SECONDARY ION-MASS SPECTROMETRY; SECONDARY IONS;

DROPS;

EID: 77049094197     PISSN: 09514198     EISSN: 10970231     Source Type: Journal    
DOI: 10.1002/rcm.4423     Document Type: Article

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