Selective control of edge-channel trajectories by scanning gate microscopy

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 4, 2010, Pages 1038-1041

  Paradiso, N ^a   Heun, S ^a   Roddaro, S ^a   Pfeiffer, L N ^b   West, K W ^b   Sorba, L ^a,c   Biasiol, G ^c   Beltram, F ^a  

^a INFM   (Italy)

^b LUCENT TECHNOLOGIES   (United States)

^c LABORATORIO TASC   (Italy)

Author keywords

Edge channels; Quantum Hall effect; Quantum point contact; Scanning gate microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPES; DEVICE ARCHITECTURES; EDGE CHANNELS; ELECTRONIC MACH-ZEHNDER INTERFEROMETER; OF QUANTUM-INFORMATION; PRECISE CONTROL; QUANTUM HALL EFFECT; QUANTUM HALL REGIME; QUANTUM POINT CONTACT; SCANNING GATE MICROSCOPY; SELECTIVE CONTROL;

GYRATORS; HALL EFFECT; HALL EFFECT DEVICES; INTERFEROMETERS; INTERFEROMETRY; POINT CONTACTS; QUANTUM CHEMISTRY; QUANTUM OPTICS; QUANTUM THEORY; SCANNING;

MAGNETIC FIELD EFFECTS;

EID: 76949108815     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.11.146     Document Type: Article

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