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Volumn 93, Issue 4, 2004, Pages

Interedge strong-to-weak scattering evolution at a constriction in the fractional quantum hall regime

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; DATA REDUCTION; ELECTRIC BREAKDOWN; ELECTRIC EXCITATION; ELECTRIC POTENTIAL; ELECTRON TUNNELING; ELECTROSTATICS; FERMI LIQUIDS; FERMIONS; HALL EFFECT; PARAMETER ESTIMATION; SCANNING ELECTRON MICROSCOPY;

EID: 4344591486     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.046801     Document Type: Article
Times cited : (62)

References (29)
  • 21
    • 0038164596 scopus 로고    scopus 로고
    • Y. Chung et al., Phys. Rev. B 67, 201104 (2003).
    • (2003) Phys. Rev. B , vol.67 , pp. 201104
    • Chung, Y.1
  • 23
    • 4344655870 scopus 로고    scopus 로고
    • E. Papa and A. H. MacDonald (to be published)
    • E. Papa and A. H. MacDonald (to be published).
  • 26
    • 85088489674 scopus 로고    scopus 로고
    • note
    • 2 ≈ 77.4 kΩ can be explained as due to partial reflection of the edge tunneling current at the ground contact 2. This effect is stronger in the high reflection limit reached at the lowest temperatures [top of Fig. 2(a)].
  • 27
    • 85088492870 scopus 로고    scopus 로고
    • note
    • ac ≈ 10 mK, well below our lowest accessible temperature.
  • 29
    • 85088492996 scopus 로고    scopus 로고
    • note
    • 2/'v*.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.