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Journal of Applied Physics

Volumn 107, Issue 3, 2010, Pages

Thermal stability of microstructural and optical modifications induced in sapphire by ultrafast laser filamentation

(4) Benayas, A a Jaque, D a McMillen, Ben b Chen, K P b

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

b University of Pittsburgh (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING TEMPERATURES; ELECTRONIC-POLARIZABILITY; FILAMENTATION; INDUCED STRESS; MICRO-STRUCTURAL; OPTICAL MODIFICATIONS; OPTICAL PROBE; PINNING CENTER; SAPPHIRE CRYSTAL; SPATIAL LOCATION; STRAIN FIELDS; STRESS-INDUCED; THERMAL STABILITY; ULTRAFAST LASER; WAVE-GUIDING;

DEFECTS; FILAMENTS (LAMP); REFRACTIVE INDEX; SAPPHIRE; ULTRAFAST LASERS; ULTRAFAST PHENOMENA; WAVEGUIDES;

THERMODYNAMIC STABILITY;

EID: 76949107362 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3280029 Document Type: Article

Times cited : (18)

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