High repetition rate UV ultrafast laser inscription of buried channel waveguides in Sapphire: Fabrication and fluorescence imaging via ruby R lines

Optics Express

Volumn 17, Issue 12, 2009, Pages 10076-10081

  Benayas, Antonio ^a   Jaque, Daniel ^a   McMillen, Ben ^b   Chen, Kevin P ^b  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b University of Pittsburgh   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; REFRACTIVE INDEX; SAPPHIRE; ULTRAFAST LASERS; WAVEGUIDES;

CRYSTAL NETWORKS; ELECTRONIC-POLARIZABILITY; FLUORESCENCE ANALYSIS; FLUORESCENCE IMAGING; HIGH REPETITION RATE; MICRO-STRUCTURAL; PROPAGATION PROPERTIES; REFRACTIVE INDEX INCREMENT;

PULSE REPETITION RATE;

ALUMINUM OXIDE;

ARTICLE; CHEMISTRY; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; FLUORESCENCE MICROSCOPY; LASER; METHODOLOGY; OPTICAL INSTRUMENTATION; RADIATION EXPOSURE; REFRACTOMETRY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY; ULTRAVIOLET RADIATION;

ALUMINUM OXIDE; COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; LASERS; MICROSCOPY, FLUORESCENCE; OPTICAL DEVICES; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTIES; ULTRAVIOLET RAYS;

EID: 66849087520     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.010076     Document Type: Article

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