Low-temperature resistivity anomalies in periodic curved surfaces

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 4, 2010, Pages 1224-1227

  Ono, Shota ^a   Shima, Hiroyuki ^a,b  

^a HOKKAIDO UNIVERSITY   (Japan)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

Electron electron umklapp scattering; Low temperature resistivity; Surface curvature

Indexed keywords

ACTUAL EXPERIMENTS; CURVED SURFACES; ELECTRICAL RESISTIVITY; GEOMETRIC PARAMETER; LOW TEMPERATURES; LOW-TEMPERATURE RESISTIVITY; MATERIAL CONSTANT; MAXIMAL VALUES; MOTION OF ELECTRONS; SEMICONDUCTOR FILMS; SPECIFIC VALUES; SURFACE CORRUGATIONS; SURFACE CURVATURES; TWO PARAMETER; UMKLAPP SCATTERING;

ELECTRIC CONDUCTIVITY; ELECTRONS;

SURFACES;

EID: 76949088394     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.11.103     Document Type: Article

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