Tuning the electrical resistivity of semiconductor thin films by nanoscale corrugation

Physical Review B - Condensed Matter and Materials Physics

Volumn 79, Issue 23, 2009, Pages

  Ono, Shota ^a   Shima, Hiroyuki ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 67650096942     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.79.235407     Document Type: Article

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