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Volumn 169, Issue 3, 2010, Pages 431-437

The resolution dependence of optimal exposures in liquid nitrogen temperature electron cryomicroscopy of catalase crystals

Author keywords

Catalase; Critical exposure; Electron cryomicroscopy; Optimal exposure; Radiation damage

Indexed keywords

CATALASE; LIQUID NITROGEN;

EID: 76749094569     PISSN: 10478477     EISSN: 10958657     Source Type: Journal    
DOI: 10.1016/j.jsb.2009.11.014     Document Type: Article
Times cited : (65)

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